A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• properties using multifrequency and multimodal AFM operation modes. Research of new quantum materials and devices, however, often requires low temperatures and ultrahigh vacuum (UHV) conditions and, more specifically, AFM instrumentation providing atomic resolution. For this, AFM instrumentation based on a

• . We further demonstrate that this instrument can be used for multimodal AFM operation, for example, to simultaneously map vertical and lateral forces and tunneling current signals with atomic resolution. It also permits the measurement of weak forces with high measurement bandwidths permitting the

• measurement noise and measurement bandwidth. They further permit multimodal AFM operation schemes [58] at the cost of an increased complexity of the instrumentation, arising from the need of an additional deflection sensor, which needs to be positioned relative to the cantilever. As discussed by Kobayashi et

A review of demodulation techniques for multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

• components. Small interaction forces associated with higher-harmonic AFM have been imaged in free air [18] as well as liquid [19]. This has lead to relatively large biological objects being imaged including viruses [20] and cells [21]. Multimodal AFM, where two or more resonance frequencies are driven, has

Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

• Steven Ian Moore,
• Michael G. Ruppert and
• Yuen Kuan Yong

Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

• multifrequency AFM and has the potential to provide higher resolution imaging on higher order modes. Keywords: atomic force microscopy; multifrequency AFM; multimodal AFM; piezoelectric cantilever, self-sensing; Introduction The invention of the atomic force microscope (AFM) [1] provided for the observation of

Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

• Stanislav S. Borysov,
• Daniel Forchheimer and
• David B. Haviland

Beilstein J. Nanotechnol. 2014, 5, 1899–1904, doi:10.3762/bjnano.5.200

• physical amplitude of a higher eigenmode. Keywords: atomic force microscopy; calibration; multimodal AFM; multifrequency AFM; Introduction Atomic force microscopy [1] (AFM) is one of the primary methods of surface analysis with resolution at the nanometer scale. In a conventional AFM an object is scanned

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air

• Santiago D. Solares,
• Sangmin An and
• Christian J. Long

Beilstein J. Nanotechnol. 2014, 5, 1637–1648, doi:10.3762/bjnano.5.175

• interactions between them [20][21][22] (see also Figure 4c and Figure 4d below, which offer an experimental example in which not all eigenmodes oscillate in the same regime). As a result, the spectroscopy theory previously developed for bimodal AFM [25][26] is not necessarily applicable to multimodal AFM. The

• amplitude or phase response is not necessarily preserved for different eigenmodes (this is especially true when not all eigenmodes operate in the same imaging regime, as illustrated in Figure 4d). Engaged frequency response A key consideration regarding the acquisition of meaningful results with multimodal

• AFM imaging is the quality of the amplitude vs frequency curve of the higher eigenmodes while the cantilever and sample are engaged [20] (this is similar to the usual tuning curve, but with the cantilever and sample engaged). Specifically the degree to which these curves resemble the response of a